Metrology News reports Hamar Laser Instruments enhanced its L-703SP Surface Plate Calibration System with an optional Lapping Line View module in Plane6 software and a mirrored A-703SP-LM-M surface-plate mounting fixture for calibration and resurfacing workflows; cited specifics include single-line flatness checks in about 2-4 minutes during lapping, laser-based geometry calibration intended to reduce reliance on slower electronic levels, flexible measuring increments, high-resolution repeatable data collection, use where wall or obstruction clearance requires reversed fixture orientation, and a USD 2.6 million U.S. Air Force contract covering up to 84 L-703SP systems over four years for Air Force and Air National Guard bases.
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Cycle News published an FIM release detailing a multi-year FIM and Hexagon partnership to modernize WorldSBK motorcycle homologation and technical-compliance checks using portable dimensional metrology instead of slower traditional methods; cited workflow specifics include Hexagon Absolute Arm 7-Axis portable measuring arms, Absolute Scanner AS1 laser scanning, Inspire software comparison of scan data against homologated CAD and tolerances, portable deployment at FIM headquarters, manufacturer sites, and trackside pits, checks ranging from small engine parts to frames, chassis, and full aerodynamic packages, spot checks through the remaining four 2026 WorldSBK rounds, and planned expansion to 2027 homologation plus FIM Endurance World Championship and World Supersport workflows.
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General Atomics detailed its EXCALIBUR Experimental X-ray CALIBration UseR facility for laboratory X-ray metrology, combining X-ray sources, precision detectors, cameras, automated stages, and analysis tools to non-destructively characterize thin films, foils, filters, X-ray crystals, and diagnostic optics used in fusion, semiconductor, sensor, space, and advanced-manufacturing research; cited specifications include Mo, W, Cu, and Cr windowless sources plus Cu, Ti, and Pt windowed sources at 30 kV and up to 10 mA, silicon-drift detection from 1 keV to 30 keV, X-ray CCD coverage from 30 eV to 10 keV, photon-counting camera coverage from 5.4 keV to 22 keV, a motorized stage with 200 mm travel and 1 micron repeatability, motorized slit adjustment from 1 micron to 8 mm, goniometer crystal control from 0 degrees to 15 degrees with 0.64 mdeg repeatability, and measurement workflows for areal density, thickness mapping, filter calibration, opacity database revision, integrated reflectivity, and topographic crystal calibration.
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Metrology News reports PI introduced the A-123 PIglide Air Bearing Linear Slide for nanometer-class scanning, metrology, inspection, precision automation, optics, photonics, semiconductor, aerospace-test, and cleanroom applications; cited specifications include a direct-drive 3-phase brushless linear motor, actively preloaded noncontact air bearings, closed-loop encoder feedback to 1 nm resolution, 50 mm to 750 mm travel options, a 210 mm x 210 mm motion platform, payload capacity up to 40 kg, straightness and flatness errors as low as +/-0.25 micron, 3 g peak acceleration equal to 30 m/s2 unloaded, 1000 mm/s maximum velocity, horizontal, vertical, and inverted mounting, XY, XY-Theta, and XYZ assemblies, and A-800 ACS-based EtherCAT motion controllers for synchronized high-speed scanning and contouring.
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Metrology News reports Revopoint launched the Trackit SR wireless optical-tracking 3D scanner for aerospace, automotive, quality-control, reverse-engineering, field-inspection, mold, casting, and complex-component workflows where markers, cables, sprays, or inspection-room-only setups add time; cited specifications include marker-free real-time optical tracking, three blue-laser modes with 30 cross lines for fine scanning, 17 parallel lines for larger surfaces, and a single line for deep holes, single-frame accuracy of 0.02 mm, volumetric accuracy of 0.02 mm + 0.04 mm x L(m), integrated temperature sensors to limit drift, a CMM Edition certified ball plate for on-site accuracy validation, Wi-Fi 6 communication from both scanner and tracker to the PC, up to 2.5 hours of handheld battery operation, operation in ambient light up to 100000 lux, and Revo Measure GD&T, deviation-inspection, reporting, STEP, IGES, and STL workflow support.
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FARO CREAFORM announced four additions to the HandySCAN 3D family, pairing new HandySCAN EVO and EVO Plus models for everyday inspection with HandySCAN MAX EVO and MAX EVO Elite models for large-part portable metrology; cited specifics include wireless cable-free measurement when paired with the Mobility Kit, embedded-screen guided workflows, ISO/IEC 17025-accredited calibration and VDI/VDE 2634 testing, MAX EVO volumetric accuracy of 0.150 mm plus 0.020 mm/m, MAX EVO Elite volumetric accuracy of 0.075 mm plus 0.010 mm/m for inspection and NDT workflows, QR-code reading on Elite models to launch inspection programs faster, and integration with Creaform Metrology Suite for scan-to-report workflows across small parts and large complex components.
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Renishaw announced the RUP60 ultrasonic thickness-measurement probe for machine tools, targeting automated single-sided inspection of large metal workpieces directly on the CNC machine instead of moving parts to separate equipment or relying on manual ultrasonic checks; cited specifications include 0.7 mm to 30 mm material-thickness coverage with one stylus, measurement in two seconds per point, accuracy better than 10 microns, 2 micron repeatability, operation with or without coupling fluid, QE radio communication through the RMM-QE receiver, a Universal Sensor Interface for data-rich processing, and compatibility with Inspection Plus, Set and Inspect, and Renishaw Central for adaptive cut-measure-cut machining and traceable in-process verification.
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Renishaw announced the RMP400S multi-purpose machine-tool spindle probe for IMTS 2026 and AMB 2026, combining touch-trigger probing, high-density scanning, and surface-finish verification in a single on-machine sensor; cited specifications include patented RENGAGE strain-gauge technology, 0.25 micron 2 sigma repeatability, Ra 0.5 micron surface-finish capability, lower trigger forces to reduce part marking, support for run-out, form, flatness, roughness, and waviness measurements, single-probe bore and boss workflows, enhanced Inspection Plus scanning cycles, Set and Inspect programming without extensive G-code knowledge, and Renishaw Central reporting integration for in-process control and traceability.
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Metrology News reports Detection Technology launched the X-Panel 4386a FPI, a large-area a-Si TFT flat-panel X-ray detector for high-throughput industrial CT and digital radiography; cited specifications include a 430 x 860 mm active area, 140 micron pixel size, 3072 x 6144 matrix, dual-side readout, up to 15 fps full-resolution imaging, 45 fps in 3 x 3 binning, 90 fps in 6 x 6 binning, 10G BASE-T data transfer, DRZ-Plus and CsI scintillator options, and target use in automotive battery inspection, aerospace composites, heavy castings, defense and ammunition inspection, and conveyor-based production systems where fewer scans and reduced stitching artifacts can raise inspection throughput.
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Metrology News reports PMT Technologies introduced the SMARTSCAN handheld 3D scanner for on-site dimensional inspection, reverse engineering, and digital manufacturing workflows; cited specifications include a roughly 530 gram scanner body excluding battery, 4.8 W power consumption to limit thermal drift, 51-line cross-laser mode for rapid surface capture, 7-line parallel mode for fine details, single-line mode for deep holes and slots, capture rates up to 5.5 million measurements per second, maximum scan area of 700 x 600 mm, integrated RGB texture capture, SkyForm mesh processing, PMT Inspect GD&T evaluation and automated reporting, and optional robot or photogrammetry integration for automated inspection cells.
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Quality Magazine reports SPECTRO introduced the SPECTROPORT LIBS PXL01 portable optical-emission metals analyzer for field alloy identification and concentration checks; cited specifics include LIBS-based OES with split-body dual optical systems for VUV and non-VUV wavelengths, reliable on-site measurement of carbon, phosphorus, and sulfur beyond typical handheld LIBS/XRF limitations, 2-6 second measurement times, optional UV probe, operation with or without argon, two replaceable batteries supporting up to 120 measurements per hour for up to 4.5 hours, iCAL 2.0 single-sample daily standardization, WLAN/LAN-to-USB data access, and grade identification, grade control, and pass/fail sorting workflows for worksite, receiving, and shipment verification.
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ETMM reports LK Metrology introduced Ethernet-ready CMM laser scanners and supporting sensor-interface hardware for automated dimensional inspection and 3D surface digitization; cited specifics include LC15DX, L100NX, and SLK25 line scanners plus XC65DX and XC65DXLS cross scanners, high-speed industry-standard Ethernet communication replacing SDI for new deployments, retained measurement specifications from prior scanner generations, 19-inch rack-mount and desktop interface-controller options for retrofit to many CMM brands while retaining the original controller, integration with LK Focus point-cloud inspection software for CAD comparison and color-map reporting, Ethernet probe-ready configurations across Altera C, S, M, SF, SL, Maxima, and HC90 CMM lines, and immediate worldwide availability.
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Nova announced that a leading global foundry selected its Nova WMC platform as tool of record for multiple-layer measurement in advanced packaging production flows after a competitive evaluation; cited capabilities include modular and customizable metrology for high warpage, non-symmetric shapes, and varied surface conditions in one tool, high-throughput repeatable scanning, large-area mapping at nanometer-level fidelity, and broader adoption across memory, foundry, advanced-packaging, and HBM applications where package-level dimensional control is becoming a bottleneck.
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Metrology News reports Phase3D closed an oversubscribed USD 2.9 million funding round led by Quest Venture Partners to expand manufacturing capacity, software, data science, and customer support for its Fringe Inspection platform; the system uses structured-light metrology to create quantitative layer-by-layer height maps during metal powder bed fusion builds, helping detect process anomalies before post-build inspection, and the company cites roughly 25 enterprise customers across aerospace, defense, and industrial sectors including NASA, the U.S. Air Force, and the U.S. Navy as it moves from custom builds toward standardized product manufacturing.
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Quality Magazine reports Faro Creaform updated its Laser Line Probe portfolio for Quantum X FaroArm and Quantum Max FaroArm systems with DTEX image-processing improvements aimed at dark, shiny, reflective, and high-contrast surfaces; cited specifics include up to 60% improvement in time to data on representative challenging parts, cleaner and more consistent point clouds with less acquisition-parameter tuning, support across FAROBlu xR, xS, and xP probes, and integration with the FARO 8 Axis Max rotary worktable using encoded part rotation for larger or more complex portable-CMM inspection, reverse engineering, and CAD-comparison workflows traceable to ISO 17025 accredited calibration.
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Metrology News reports Gen Precision announced the GTK-OSI1 Automated Passive Optical Component Inspection Machine for fiber arrays, V-grooves, MT ferrules, and MMC ferrules used in silicon photonics and co-packaged optics; cited capabilities include an 18 megapixel dual-CCD vision system separating feature recognition from precision measurement, 3-sigma repeatability up to +/-0.05 micron for fiber arrays and V-grooves and +/-0.1 micron for MT and MMC ferrules, semiconductor-grade three-axis positioning, Smart-Point Configuration, a Geo-Trajectory Algorithm, batch inspection of up to 20 ferrules per cycle, and less than one second per hole or groove measurement.
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The European Commission approved EUR 76 million in German state aid for QuantumDiamonds GmbH to establish the EU's first production facility for semiconductor metrology and inspection systems based on novel quantum diamond sensors in Munich; the company's total facility investment is EUR 152 million, the IPF-ATEST project targets high-resolution 3D testing of modern chips using quantum sensing, QuantumDiamonds has completed proof-of-concept projects with nine of the ten largest global chipmakers, and the facility is applying for Integrated Production Facility status under the EU Chips Act.
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Nearfield Instruments closed a USD 380 million Series D funding round at a USD 1.6 billion valuation, led by Fidelity Management with Temasek, Walden Catalyst, M&G Investments, Invest-NL, and Qatar Investment Authority; the company says it is the largest deep-tech raise in the Netherlands and will fund innovation roadmap acceleration, worldwide Applications Centers of Excellence, expanded production capacity, and global customer support for semiconductor 3D metrology targeting High-NA EUV, Gate-All-Around, CFET, and hybrid-bonded 3D integration process control, giving a measurable capital-markets signal for semiconductor metrology as AI-driven chip architectures raise process-control intensity.
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Applied Materials introduced a suite of new semiconductor manufacturing systems including VeritySEM 7AP CD metrology and SEMVision G7AP defect analysis eBeam tools purpose-built for advanced packaging inspection; cited specifics include sub-10 nm metrology sensitivity, wafer-fab-grade measurement and defect review extended to hybrid-bonded 3D packages and chiplet architectures, plus companion Centura Prime Epi with 20% smaller footprint, Opta Quad CMP for hybrid-bonding uniformity, Nokota VMax 2 ECD with Adaptive Pattern Tuning, and Producer Avila 2 PECVD for 12-16+ layer HBM designs, reflecting structural growth in process-control intensity for AI-driven advanced packaging manufacturing.
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The Digital Metrology Standards Consortium announced that its Model-Based Characteristics v1.0 standard, designated DMSC MBC v1.0-2026, has been approved by ANSI as an American National Standard; the standard establishes a consistent machine-readable method for identifying, defining, and exchanging product characteristics directly within digital engineering models, replacing manual drawing interpretation and enabling greater automation, improved data quality, and digital thread continuity across engineering, manufacturing, inspection, and quality systems; it complements DMSC's QIF standards and targets aerospace, defense, automotive, medical device, and industrial equipment sectors where precise product definition and quality verification are essential.
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Yole Group analysis shows the semiconductor metrology and inspection equipment market exceeded USD 18 billion in 2025, growing 15% year over year and representing approximately 14% of total wafer fab equipment spending; the firm projects the market reaching about USD 25 billion by 2031 driven by AI, HBM, advanced packaging, hybrid bonding, and High-NA EUV creating new process-control challenges, with KLA, Applied Materials, and Lasertec remaining market leaders while competition intensifies in software, analytics, hybrid metrology, and application-specific process-control segments, giving metrology-equipment manufacturers a current market-sizing and growth-trajectory reference.
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Metrology News reports SiLC Technologies launched Eyeonic Edge, a 4D area scanner for automated inspection of large stationary objects in manufacturing, warehouse automation, robotics, construction, automotive, aerospace, and shipbuilding environments; cited specifications include sub-millimeter range resolution, operating distance from 0.25 m to 10 m, 40 by 40 degree field of view, real-time region-of-interest and zooming capability, performance on dark or shiny surfaces and in dusty or outdoor lighting conditions, plus gap-and-flush, panel alignment, dent, joint, dimensional-verification, and defect-detection applications for large assemblies.
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