Industry News & Research Watch

This section curates relevant external updates for the metrology and quality software community.

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Important: These are curated external items. Metrology Central does not claim authorship of the linked source material.


IMTS 2026

IMTS 2026 runs September 14–19 in Chicago. This section tracks CMM, inspection software, and quality-related announcements, product launches, and demonstrations tied to the show.

IMTS 2026 to showcase the AI-powered future of manufacturing

Metrology News reports that IMTS 2026 (Sept. 14-19, Chicago) will be the first major industry event where industrial AI is demonstrated across the full manufacturing technology stack, from cloud platforms and AI-native applications to embedded AI inside machine controls, inspection systems, automation, and digital thread solutions; cited specifics include 1.2 million sq ft of exhibit space, more than 1800 exhibitors, 89000-plus expected attendees, a new Industrial AI Arena featuring 32 exhibitors plus Sandia National Laboratories, a full-day Industrial AI Conference, and hyperscaler participation from AWS, Google Cloud, and Microsoft showing cloud-to-factory-floor AI deployment; contextual demand signals include U.S. manufacturing technology orders of USD 2.19 billion through the first four months of 2026 (up 28.9% year over year), ISM Manufacturing PMI at 53.3 percent with six consecutive months of new-order expansion, and manufacturing labor productivity up 3.2 percent in Q1 2026 with no growth in hours worked.

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Renishaw RUP60 brings 2-second, better-than-10-micron ultrasonic thickness checks onto CNC machine tools

Renishaw announced the RUP60 ultrasonic thickness-measurement probe for machine tools, targeting automated single-sided inspection of large metal workpieces directly on the CNC machine instead of moving parts to separate equipment or relying on manual ultrasonic checks; cited specifications include 0.7 mm to 30 mm material-thickness coverage with one stylus, measurement in two seconds per point, accuracy better than 10 microns, 2 micron repeatability, operation with or without coupling fluid, QE radio communication through the RMM-QE receiver, a Universal Sensor Interface for data-rich processing, and compatibility with Inspection Plus, Set and Inspect, and Renishaw Central for adaptive cut-measure-cut machining and traceable in-process verification.

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Renishaw RMP400S combines touch-trigger probing, scanning, and Ra 0.5 micron surface-finish verification in one spindle probe

Renishaw announced the RMP400S multi-purpose machine-tool spindle probe for IMTS 2026 and AMB 2026, combining touch-trigger probing, high-density scanning, and surface-finish verification in a single on-machine sensor; cited specifications include patented RENGAGE strain-gauge technology, 0.25 micron 2 sigma repeatability, Ra 0.5 micron surface-finish capability, lower trigger forces to reduce part marking, support for run-out, form, flatness, roughness, and waviness measurements, single-probe bore and boss workflows, enhanced Inspection Plus scanning cycles, Set and Inspect programming without extensive G-code knowledge, and Renishaw Central reporting integration for in-process control and traceability.

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LK Metrology brings four CMMs, 320 kV CT, CAMIO 2026, and REVO-equipped inspection to IMTS 2026

ETMM reports LK Metrology will demonstrate a multi-sensor inspection portfolio at IMTS 2026, including ISF 04.04.04 and ISF 07.06.05 shop-floor CMMs with Renishaw MH20i heads, an Altera M 10.10.8 with PH10MQ, TP20, SP25, LC15DX, LC12DX, and L100NX laser scanning, an Altera M 15.12.10 with Scantek 5 and Renishaw REVO-2 5-axis scanning, the PXR-CT Alpha 320KV CT system, CAMIO 2026 measurement/programming/simulation/reporting software, Industry 4 Metrology Gate remote monitoring, Touch DMIS, and Focus point-cloud inspection software.

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Auto Manufacturing

AIAG and VDA publish first harmonized SPC manual for global automotive process control

Quality Magazine reports AIAG and VDA jointly published the AIAG-VDA SPC Manual, giving the global automotive supply chain a harmonized Statistical Process Control reference for machine performance, process performance, process capability, production-equipment qualification, process approval, and ongoing process monitoring; the manual is the second AIAG-VDA Core Tool harmonization after FMEA, aligns terminology and statistical-method application across regional supplier requirements, links SPC with FMEA, Control Plan, and MSA/VDA 5, and became available July 1, 2026 for manufacturers trying to reduce parallel quality processes and improve comparability of capability evidence across global production networks.

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HIKMICRO acoustic imaging targets automotive compressed-air leaks down to 0.0047 l/min and 90% faster inspections

Metrology News reports HIKMICRO AI Series acoustic imaging cameras support data-driven maintenance in automotive production by localizing compressed-air leaks and abnormal sound sources during live operations; cited specifications include up to 136 low-noise MEMS microphones, adjustable 2-96 kHz bandwidth, leak detection as small as 0.0047 l/min at 6 bar from 0.5 m, real-time visualization on a 4.3 inch touchscreen, integrated leak-rate, cost, and energy-impact analysis, inspection-time reductions up to 90%, and long-range operation up to about 150 m for welding, paint, final assembly, machining, casting, molding, and utility systems.

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Aerospace & Defense Manufacturing

Aerospace quality systems face IA9100 and CMMC convergence as digital inspection records become controlled data

Quality Magazine analyzes the convergence of aerospace quality management and cybersecurity as AS9100 transitions toward IA9100 and CMMC contractual enforcement moves into supplier flowdown; cited specifics include IA9100 final release expected in late 2026 with a two- to three-year transition window, anticipated Clause 7.1.7 emphasis on digital and infrastructure security, CMMC 2.0 Level 2 third-party assessments beginning November 10, 2026, more than 200,000 aerospace and defense suppliers affected, more than 80,000 likely requiring Level 2 certification, and direct implications for quality records systems, manufacturing execution systems, engineering data management, supplier communication platforms, and inspection data workflows.

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Velo3D triples aerospace and defense AM capacity with 289,000 sq ft Livermore production campus

Velo3D announced a new 288,747 square foot Livermore, California advanced manufacturing facility that will become its primary production campus later in 2026, adding roughly 270,000 square feet of production space with 36 foot clear heights and nearly 10 million cubic feet of manufacturing volume; the site is designed for more than 40 large-format metal additive systems at launch, infrastructure for more than 100 systems over the next few years, in-house post-processing, production-scale mission-critical component manufacturing, and a combined two-campus footprint of 125 machines supporting aerospace, defense, and energy customers moving from qualification into scaled production.

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MISTRAS Group expands Houston aerospace NDT lab with 320 kV digital radiography, ultrasonic immersion, and NADCAP accreditation target

MISTRAS Group announced expanded capabilities at its Houston, Texas in-house laboratory to support growing aerospace and defense manufacturing demand; cited additions include AWS D17.1-qualified aerospace casting weld repair and rework, dedicated immersion ultrasonic inspection tanks for forgings, 1-3 in. and 3-5 in. TacTic rotary ultrasonic inspection for bar/billet/forging examinations, fluorescent penetrant inspection, ultrasonic cleaning, DI water processing, 320 kV digital radiography, and an expected NADCAP accreditation in quality management systems, welding, radiographic testing, penetrant testing, and ultrasonic testing by late 2026, giving aerospace manufacturers a turnkey NDT and component-restoration sourcing signal.

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GE Aerospace Q2 results show USD 16.5B orders, 31% higher first-half engine deliveries, and LEAP-1B durability certification

GE Aerospace released second-quarter 2026 results with quantified demand and production signals across commercial and defense aerospace manufacturing; cited specifics include total orders of USD 16.5 billion, up 17%, GAAP revenue of USD 13.3 billion, up 21%, adjusted revenue of USD 12.6 billion, up 24%, record internal shop-visit output in the quarter, total engine deliveries up 31% in the first half, Commercial Engines & Services orders up 18% and revenue up 27%, internal shop-visit revenue up 25%, spare-parts revenue up more than 25%, Defense & Propulsion Technologies orders up 12% and revenue up 16%, priority supplier material input up double digits sequentially and year over year, backlog above USD 210 billion, and completed LEAP-1B durability-kit certification including an upgraded HPT blade expected to deliver about 2x time-on-wing improvement.

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Quality Software

Hexagon VGSTUDIO MAX 2026.2 cuts CT multi-part measurement setup time up to 50 percent

Instrumentation Monthly reports Hexagon Manufacturing Intelligence released VGSTUDIO MAX 2026.2 for high-throughput CT inspection, adding multi-part coordinate-measurement workflows where teams load entire batches of CT scans, define measurements once, and automatically synchronize CM objects across every part in a single project; cited specifics include up to 50 percent reduction in inspection-preparation and project-creation time, single-scene batch management for cross-part deviation analysis, CM Overview reporting with quality-control charts and SPC values, five NextGen editions spanning Essential, Dimensions, Analysis, Battery, and Pro, expanded GelSight profile roughness analysis, ASTM E57 point-cloud support, a redesigned displacement-analysis interface, ISO 5459:2024 datum-fit compliance, and a fast mode for porosity and inclusion analysis on large datasets.

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EyeVision automates 100 percent inline thread inspection using camera-based gap, pitch, length, and defect checks

Quality Magazine reports EVT's EyeVision software can automate non-contact inline inspection of internal and external threads with industrial cameras and image-processing tools; cited inspection outputs include thread presence, usable thread length, pitch and spacing, number of visible thread turns, missing or interrupted sections, largest gaps, irregular thread segments, burrs, contamination, damaged edges, particles, gap count, longest segment, configurable tolerance thresholds, OK/NOK decisions, PLC rejection or reporting, and 100 percent production-process inspection as an alternative to random checks or mechanical gauges for screws, nuts, connectors, machined components, and precision parts.

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Pleora iPORT GEV-TB converts GigE Vision 2.x camera streams to 22.5 Gbps Thunderbolt/USB4 PCIe video

Quality Magazine reports Pleora launched the iPORT GEV-TB External Frame Grabber for machine-vision systems that need high-bandwidth GigE Vision cameras on laptops, embedded PCs, industrial computers, or single-board systems without internal PCIe slots; cited specifications include GigE Vision 2.x camera output converted into a PCIe stream, video transmission up to 22.5 Gbps over a standard Ethernet cable to Thunderbolt 3/4 or USB4 USB-C ports, low predictable latency, direct-memory-access transfer into host memory to reduce CPU overhead, hardware packet-resend management, an integrated frame buffer for burst or high-throughput conditions, GigE Vision 2.2 and GenICam compliance, and support through Pleora's eBUS SDK for portable inspection, embedded imaging, and compact metrology system integration.

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AI ultrasonic IC inspection case targets 95-98% FPY using 3% single-bubble and 5% total-defect thresholds

Metrology News reports a semiconductor packaging case study where TM AI Vision was added to ultrasonic IC inspection after the line produced only about 50% first-pass yield and required heavy manual reinspection to reach a 95-98% production target; cited inspection rules include rejecting a single air bubble above 3% of total IC area or combined bubbles above 5%, evaluating separate IC-bubble and solder-joint ultrasonic layers, distinguishing solder-layer mapping reflections from true defects, using semantic segmentation to calculate irregular defect areas, pulling ultrasonic images over the network through TM AI+ AOI Edge, and using server-based auto-labeling and retraining to reduce operator review over successive shifts.

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KEYENCE VS-G vision system adds 32-core AI processing and 100x image compression for full inline traceability

Metrology News reports KEYENCE launched the VS-G Series AI-powered high-performance vision system for inline appearance inspection, citing a custom 32-core processor with built-in AI engine delivering up to 13x faster processing than conventional VS-L/S/C systems on a 5 megapixel AI segmentation task, dedicated image storage with 100x visual compression to retain OK and NG production images for 100% visual traceability, automated parameter tuning and historical-image back-testing to reduce false-positive risk after inspection changes, support for up to 8 independent cameras from one controller, and more than 30 area-scan camera models for electronics, semiconductor, automotive adhesive and sealant, logistics, and material-handling inspection.

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Hexagon VGSTUDIO MAX 2026.2 cuts CT metrology setup time up to 50% with multi-part measurement synchronization

Design Solutions reports Hexagon Manufacturing Intelligence released VGSTUDIO MAX 2026.2 with a multi-part coordinate-measurement workflow for high-volume CT inspection; cited capabilities include loading entire CT scan batches into one project, defining measurements once, automatic synchronization of CM objects across parts, single-scene batch management, cross-part deviation analysis, integrated CM overview and reporting with quality-control charts and SPC values, up to 50% lower inspection-preparation and project-creation time, ISO 5459:2024 datum-fit compliance, ASTM E57 point-cloud support, faster porosity and inclusion analysis, and a five-edition NextGen portfolio for aerospace, automotive, medical-device, electronics, casting, material-science, and battery workflows.

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Techman Robot high-speed AI Flying Trigger inspection cuts vision cycle time 40-50% without stopping production flow

Metrology News reports Techman Robot highlighted its High-Speed AI Flying Trigger Inspection system at Automate 2026, combining synchronized image acquisition, real-time AI defect analysis, and TMscene codeless virtual planning so parts can be inspected while moving instead of stopping at a vision station; cited impact includes inspection cycle-time reductions of 40-50% versus conventional methods, virtual validation of inspection paths and camera coverage before deployment, and target use in electronics, automotive, precision engineering, and industrial manufacturing where inline AI inspection must preserve throughput.

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Scientific Metrology

Hamar Laser L-703SP update cuts surface-plate lapping line checks to 2-4 minutes

Metrology News reports Hamar Laser Instruments enhanced its L-703SP Surface Plate Calibration System with an optional Lapping Line View module in Plane6 software and a mirrored A-703SP-LM-M surface-plate mounting fixture for calibration and resurfacing workflows; cited specifics include single-line flatness checks in about 2-4 minutes during lapping, laser-based geometry calibration intended to reduce reliance on slower electronic levels, flexible measuring increments, high-resolution repeatable data collection, use where wall or obstruction clearance requires reversed fixture orientation, and a USD 2.6 million U.S. Air Force contract covering up to 84 L-703SP systems over four years for Air Force and Air National Guard bases.

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FIM standardizes WorldSBK homologation checks with Hexagon Absolute Arm 7-Axis and AS1 scanning

Cycle News published an FIM release detailing a multi-year FIM and Hexagon partnership to modernize WorldSBK motorcycle homologation and technical-compliance checks using portable dimensional metrology instead of slower traditional methods; cited workflow specifics include Hexagon Absolute Arm 7-Axis portable measuring arms, Absolute Scanner AS1 laser scanning, Inspire software comparison of scan data against homologated CAD and tolerances, portable deployment at FIM headquarters, manufacturer sites, and trackside pits, checks ranging from small engine parts to frames, chassis, and full aerodynamic packages, spot checks through the remaining four 2026 WorldSBK rounds, and planned expansion to 2027 homologation plus FIM Endurance World Championship and World Supersport workflows.

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General Atomics EXCALIBUR calibrates X-ray optics with 1 micron stage repeatability and 0.64 mdeg crystal control

General Atomics detailed its EXCALIBUR Experimental X-ray CALIBration UseR facility for laboratory X-ray metrology, combining X-ray sources, precision detectors, cameras, automated stages, and analysis tools to non-destructively characterize thin films, foils, filters, X-ray crystals, and diagnostic optics used in fusion, semiconductor, sensor, space, and advanced-manufacturing research; cited specifications include Mo, W, Cu, and Cr windowless sources plus Cu, Ti, and Pt windowed sources at 30 kV and up to 10 mA, silicon-drift detection from 1 keV to 30 keV, X-ray CCD coverage from 30 eV to 10 keV, photon-counting camera coverage from 5.4 keV to 22 keV, a motorized stage with 200 mm travel and 1 micron repeatability, motorized slit adjustment from 1 micron to 8 mm, goniometer crystal control from 0 degrees to 15 degrees with 0.64 mdeg repeatability, and measurement workflows for areal density, thickness mapping, filter calibration, opacity database revision, integrated reflectivity, and topographic crystal calibration.

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PI A-123 air-bearing linear stage combines 1 nm encoder resolution with +/-0.25 micron straightness

Metrology News reports PI introduced the A-123 PIglide Air Bearing Linear Slide for nanometer-class scanning, metrology, inspection, precision automation, optics, photonics, semiconductor, aerospace-test, and cleanroom applications; cited specifications include a direct-drive 3-phase brushless linear motor, actively preloaded noncontact air bearings, closed-loop encoder feedback to 1 nm resolution, 50 mm to 750 mm travel options, a 210 mm x 210 mm motion platform, payload capacity up to 40 kg, straightness and flatness errors as low as +/-0.25 micron, 3 g peak acceleration equal to 30 m/s2 unloaded, 1000 mm/s maximum velocity, horizontal, vertical, and inverted mounting, XY, XY-Theta, and XYZ assemblies, and A-800 ACS-based EtherCAT motion controllers for synchronized high-speed scanning and contouring.

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Revopoint Trackit SR wireless scanner specifies 0.02 mm single-frame accuracy and marker-free optical tracking

Metrology News reports Revopoint launched the Trackit SR wireless optical-tracking 3D scanner for aerospace, automotive, quality-control, reverse-engineering, field-inspection, mold, casting, and complex-component workflows where markers, cables, sprays, or inspection-room-only setups add time; cited specifications include marker-free real-time optical tracking, three blue-laser modes with 30 cross lines for fine scanning, 17 parallel lines for larger surfaces, and a single line for deep holes, single-frame accuracy of 0.02 mm, volumetric accuracy of 0.02 mm + 0.04 mm x L(m), integrated temperature sensors to limit drift, a CMM Edition certified ball plate for on-site accuracy validation, Wi-Fi 6 communication from both scanner and tracker to the PC, up to 2.5 hours of handheld battery operation, operation in ambient light up to 100000 lux, and Revo Measure GD&T, deviation-inspection, reporting, STEP, IGES, and STL workflow support.

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FARO CREAFORM expands HandySCAN 3D with MAX EVO Elite accuracy of 0.075 mm plus 0.010 mm/m

FARO CREAFORM announced four additions to the HandySCAN 3D family, pairing new HandySCAN EVO and EVO Plus models for everyday inspection with HandySCAN MAX EVO and MAX EVO Elite models for large-part portable metrology; cited specifics include wireless cable-free measurement when paired with the Mobility Kit, embedded-screen guided workflows, ISO/IEC 17025-accredited calibration and VDI/VDE 2634 testing, MAX EVO volumetric accuracy of 0.150 mm plus 0.020 mm/m, MAX EVO Elite volumetric accuracy of 0.075 mm plus 0.010 mm/m for inspection and NDT workflows, QR-code reading on Elite models to launch inspection programs faster, and integration with Creaform Metrology Suite for scan-to-report workflows across small parts and large complex components.

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Renishaw RUP60 brings 2-second, better-than-10-micron ultrasonic thickness checks onto CNC machine tools

Renishaw announced the RUP60 ultrasonic thickness-measurement probe for machine tools, targeting automated single-sided inspection of large metal workpieces directly on the CNC machine instead of moving parts to separate equipment or relying on manual ultrasonic checks; cited specifications include 0.7 mm to 30 mm material-thickness coverage with one stylus, measurement in two seconds per point, accuracy better than 10 microns, 2 micron repeatability, operation with or without coupling fluid, QE radio communication through the RMM-QE receiver, a Universal Sensor Interface for data-rich processing, and compatibility with Inspection Plus, Set and Inspect, and Renishaw Central for adaptive cut-measure-cut machining and traceable in-process verification.

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Renishaw RMP400S combines touch-trigger probing, scanning, and Ra 0.5 micron surface-finish verification in one spindle probe

Renishaw announced the RMP400S multi-purpose machine-tool spindle probe for IMTS 2026 and AMB 2026, combining touch-trigger probing, high-density scanning, and surface-finish verification in a single on-machine sensor; cited specifications include patented RENGAGE strain-gauge technology, 0.25 micron 2 sigma repeatability, Ra 0.5 micron surface-finish capability, lower trigger forces to reduce part marking, support for run-out, form, flatness, roughness, and waviness measurements, single-probe bore and boss workflows, enhanced Inspection Plus scanning cycles, Set and Inspect programming without extensive G-code knowledge, and Renishaw Central reporting integration for in-process control and traceability.

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Detection Technology X-Panel XL detector reaches 430 x 860 mm active area and 90 fps binning for industrial CT

Metrology News reports Detection Technology launched the X-Panel 4386a FPI, a large-area a-Si TFT flat-panel X-ray detector for high-throughput industrial CT and digital radiography; cited specifications include a 430 x 860 mm active area, 140 micron pixel size, 3072 x 6144 matrix, dual-side readout, up to 15 fps full-resolution imaging, 45 fps in 3 x 3 binning, 90 fps in 6 x 6 binning, 10G BASE-T data transfer, DRZ-Plus and CsI scintillator options, and target use in automotive battery inspection, aerospace composites, heavy castings, defense and ammunition inspection, and conveyor-based production systems where fewer scans and reduced stitching artifacts can raise inspection throughput.

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PMT SMARTSCAN handheld scanner captures up to 5.5M measurements/s with 51-line blue-laser mode

Metrology News reports PMT Technologies introduced the SMARTSCAN handheld 3D scanner for on-site dimensional inspection, reverse engineering, and digital manufacturing workflows; cited specifications include a roughly 530 gram scanner body excluding battery, 4.8 W power consumption to limit thermal drift, 51-line cross-laser mode for rapid surface capture, 7-line parallel mode for fine details, single-line mode for deep holes and slots, capture rates up to 5.5 million measurements per second, maximum scan area of 700 x 600 mm, integrated RGB texture capture, SkyForm mesh processing, PMT Inspect GD&T evaluation and automated reporting, and optional robot or photogrammetry integration for automated inspection cells.

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SPECTROPORT LIBS PXL01 portable OES analyzer brings 2-6 second field metals checks with C, P, and S coverage

Quality Magazine reports SPECTRO introduced the SPECTROPORT LIBS PXL01 portable optical-emission metals analyzer for field alloy identification and concentration checks; cited specifics include LIBS-based OES with split-body dual optical systems for VUV and non-VUV wavelengths, reliable on-site measurement of carbon, phosphorus, and sulfur beyond typical handheld LIBS/XRF limitations, 2-6 second measurement times, optional UV probe, operation with or without argon, two replaceable batteries supporting up to 120 measurements per hour for up to 4.5 hours, iCAL 2.0 single-sample daily standardization, WLAN/LAN-to-USB data access, and grade identification, grade control, and pass/fail sorting workflows for worksite, receiving, and shipment verification.

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LK Metrology moves CMM laser scanners to Ethernet across LC15DX, L100NX, SLK25, XC65DX, and XC65DXLS sensors

ETMM reports LK Metrology introduced Ethernet-ready CMM laser scanners and supporting sensor-interface hardware for automated dimensional inspection and 3D surface digitization; cited specifics include LC15DX, L100NX, and SLK25 line scanners plus XC65DX and XC65DXLS cross scanners, high-speed industry-standard Ethernet communication replacing SDI for new deployments, retained measurement specifications from prior scanner generations, 19-inch rack-mount and desktop interface-controller options for retrofit to many CMM brands while retaining the original controller, integration with LK Focus point-cloud inspection software for CAD comparison and color-map reporting, Ethernet probe-ready configurations across Altera C, S, M, SF, SL, Maxima, and HC90 CMM lines, and immediate worldwide availability.

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Nova WMC selected as tool of record for advanced-packaging metrology across multiple foundry layers

Nova announced that a leading global foundry selected its Nova WMC platform as tool of record for multiple-layer measurement in advanced packaging production flows after a competitive evaluation; cited capabilities include modular and customizable metrology for high warpage, non-symmetric shapes, and varied surface conditions in one tool, high-throughput repeatable scanning, large-area mapping at nanometer-level fidelity, and broader adoption across memory, foundry, advanced-packaging, and HBM applications where package-level dimensional control is becoming a bottleneck.

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Phase3D raises USD 2.9M to scale structured-light in-situ inspection for metal additive manufacturing

Metrology News reports Phase3D closed an oversubscribed USD 2.9 million funding round led by Quest Venture Partners to expand manufacturing capacity, software, data science, and customer support for its Fringe Inspection platform; the system uses structured-light metrology to create quantitative layer-by-layer height maps during metal powder bed fusion builds, helping detect process anomalies before post-build inspection, and the company cites roughly 25 enterprise customers across aerospace, defense, and industrial sectors including NASA, the U.S. Air Force, and the U.S. Navy as it moves from custom builds toward standardized product manufacturing.

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Faro Creaform DTEX update improves Laser Line Probe time to data up to 60% on difficult surfaces

Quality Magazine reports Faro Creaform updated its Laser Line Probe portfolio for Quantum X FaroArm and Quantum Max FaroArm systems with DTEX image-processing improvements aimed at dark, shiny, reflective, and high-contrast surfaces; cited specifics include up to 60% improvement in time to data on representative challenging parts, cleaner and more consistent point clouds with less acquisition-parameter tuning, support across FAROBlu xR, xS, and xP probes, and integration with the FARO 8 Axis Max rotary worktable using encoded part rotation for larger or more complex portable-CMM inspection, reverse engineering, and CAD-comparison workflows traceable to ISO 17025 accredited calibration.

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Gen Precision GTK-OSI1 dual-CCD platform reaches 3-sigma 0.05 micron repeatability for passive optical component inspection

Metrology News reports Gen Precision announced the GTK-OSI1 Automated Passive Optical Component Inspection Machine for fiber arrays, V-grooves, MT ferrules, and MMC ferrules used in silicon photonics and co-packaged optics; cited capabilities include an 18 megapixel dual-CCD vision system separating feature recognition from precision measurement, 3-sigma repeatability up to +/-0.05 micron for fiber arrays and V-grooves and +/-0.1 micron for MT and MMC ferrules, semiconductor-grade three-axis positioning, Smart-Point Configuration, a Geo-Trajectory Algorithm, batch inspection of up to 20 ferrules per cycle, and less than one second per hole or groove measurement.

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EU approves EUR 76M German state aid for QuantumDiamonds to build first quantum-sensor semiconductor metrology and inspection facility

The European Commission approved EUR 76 million in German state aid for QuantumDiamonds GmbH to establish the EU's first production facility for semiconductor metrology and inspection systems based on novel quantum diamond sensors in Munich; the company's total facility investment is EUR 152 million, the IPF-ATEST project targets high-resolution 3D testing of modern chips using quantum sensing, QuantumDiamonds has completed proof-of-concept projects with nine of the ten largest global chipmakers, and the facility is applying for Integrated Production Facility status under the EU Chips Act.

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Nearfield Instruments raises USD 380M Series D at USD 1.6B valuation for AI-era semiconductor metrology and inspection

Nearfield Instruments closed a USD 380 million Series D funding round at a USD 1.6 billion valuation, led by Fidelity Management with Temasek, Walden Catalyst, M&G Investments, Invest-NL, and Qatar Investment Authority; the company says it is the largest deep-tech raise in the Netherlands and will fund innovation roadmap acceleration, worldwide Applications Centers of Excellence, expanded production capacity, and global customer support for semiconductor 3D metrology targeting High-NA EUV, Gate-All-Around, CFET, and hybrid-bonded 3D integration process control, giving a measurable capital-markets signal for semiconductor metrology as AI-driven chip architectures raise process-control intensity.

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Applied Materials launches VeritySEM 7AP and SEMVision G7AP eBeam metrology and defect review for advanced packaging fabs

Applied Materials introduced a suite of new semiconductor manufacturing systems including VeritySEM 7AP CD metrology and SEMVision G7AP defect analysis eBeam tools purpose-built for advanced packaging inspection; cited specifics include sub-10 nm metrology sensitivity, wafer-fab-grade measurement and defect review extended to hybrid-bonded 3D packages and chiplet architectures, plus companion Centura Prime Epi with 20% smaller footprint, Opta Quad CMP for hybrid-bonding uniformity, Nokota VMax 2 ECD with Adaptive Pattern Tuning, and Producer Avila 2 PECVD for 12-16+ layer HBM designs, reflecting structural growth in process-control intensity for AI-driven advanced packaging manufacturing.

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DMSC Model-Based Characteristics v1.0 receives ANSI approval as American National Standard for digital product definition and metrology interoperability

The Digital Metrology Standards Consortium announced that its Model-Based Characteristics v1.0 standard, designated DMSC MBC v1.0-2026, has been approved by ANSI as an American National Standard; the standard establishes a consistent machine-readable method for identifying, defining, and exchanging product characteristics directly within digital engineering models, replacing manual drawing interpretation and enabling greater automation, improved data quality, and digital thread continuity across engineering, manufacturing, inspection, and quality systems; it complements DMSC's QIF standards and targets aerospace, defense, automotive, medical device, and industrial equipment sectors where precise product definition and quality verification are essential.

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Yole Group reports semiconductor metrology and inspection equipment market tops USD 18B with 15% 2025 growth and USD 25B projected by 2031

Yole Group analysis shows the semiconductor metrology and inspection equipment market exceeded USD 18 billion in 2025, growing 15% year over year and representing approximately 14% of total wafer fab equipment spending; the firm projects the market reaching about USD 25 billion by 2031 driven by AI, HBM, advanced packaging, hybrid bonding, and High-NA EUV creating new process-control challenges, with KLA, Applied Materials, and Lasertec remaining market leaders while competition intensifies in software, analytics, hybrid metrology, and application-specific process-control segments, giving metrology-equipment manufacturers a current market-sizing and growth-trajectory reference.

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SiLC Eyeonic Edge brings sub-millimeter 4D inspection to large objects up to 10 m away

Metrology News reports SiLC Technologies launched Eyeonic Edge, a 4D area scanner for automated inspection of large stationary objects in manufacturing, warehouse automation, robotics, construction, automotive, aerospace, and shipbuilding environments; cited specifications include sub-millimeter range resolution, operating distance from 0.25 m to 10 m, 40 by 40 degree field of view, real-time region-of-interest and zooming capability, performance on dark or shiny surfaces and in dusty or outdoor lighting conditions, plus gap-and-flush, panel alignment, dent, joint, dimensional-verification, and defect-detection applications for large assemblies.

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